A base model was developed for each of the subassembly cells under study. The base model simulation was run without the effects of downtime to verify that objective #1 was achieved and that input parameters were correct. Based on a random approach, downtime effects were applied to the model, and changes in the system behavior were recorded. This allowed the identification of system bottlenecks from statistical data. “What-if” scenarios were then performed on the simulation model to determine how the effects of downtime, material shortages, and operator over cycles can be offset, thereby improving throughput.
